5G mmWave Semiconductor Device Test
Published by NI
Automating Front-End Module, Beamformer, and AiP Test.
To achieve some of the ambitious Key Performance Indicators of 5G enhanced Mobile Broadband, semiconductor devices for 5G infrastructure need to empower reliable multi-user MIMO (MU-MIMO) functionality at mmWave frequencies with larger channel bandwidths.
Discover how National Instruments empowers engineers to solve the greatest test challenges of 5G semiconductor devices by downloading this solution flyer.