5G mmWave Semiconductor Device Test

Published by NI

Automating Front-End Module, Beamformer, and AiP Test.

To achieve some of the ambitious Key Performance Indicators of 5G enhanced Mobile Broadband, semiconductor devices for 5G infrastructure need to empower reliable multi-user MIMO (MU-MIMO) functionality at mmWave frequencies with larger channel bandwidths. 

Discover how National Instruments empowers engineers to solve the greatest test challenges of 5G semiconductor devices by downloading this solution flyer.

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