Signal Model Based Approach to Joint Jitter and Noise Decomposition
This resource is published by Rohde & Schwarz
In this whitepaper, Rohde & Schwarz introduces a joint jitter and noise analysis framework for serial PAM transmission based on a parametric signal model. The approach has several benefits over other state-of-the-art methods.
The identification of jitter and noise sources is critical when debugging failure sources in the transmission of high-speed serial signals. With ever-increasing data rates accompanied by decreasing jitter budgets and noise margins, managing jitter and noise sources remains a critical consideration for engineers. Methods for decomposing jitter have matured considerably over the past 20 years; however, they are mostly based on time interval error (TIE) measurements alone. This TIE-centric view discards a significant portion of the information present in the input signal and thus limits the decomposition accuracy.
In this whitepaper from Rohde & Schwarz, discover example measurement results as well as comparisons with other methodologies.
Components, Power, Analog, Industrial, Communication