USB 3.2 Compliance Testing
This resource is published by Rohde & Schwarz
This webinar is intended for engineers who work on high-speed digital design and test. In particular, we will be focusing at USB interfaces.
After a quick introduction into USB technology we will be discussing the details of USB 2.0 and 3.2 compliance testing. The webinar will enable you to learn common signal integrity issues, and we will be guiding you through related challenges.
These include full and low-speed eye, back voltage, inrush current, spread spectrum clocking, jitter and eye, pre-shoot / de-emphasis and many more. Practical examples and demonstrations illustrate USB compliance testing made easy and reliable.
Test & Measurement, Embedded, Wireless testing, Microcontrollers, Development and debug tools, Evaluation boards, SBCs and modules, Embedded operating systems and software, Edge computing, Laboratory/bench equipment, Automated test equipment, Field-test equipment, Boundary scan equipment, Test probes and pins, Test software